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X-SCORE I  | | X-Ray attenuation data analysis, X-SCORE is the latest non-destructive system for measuring the residual score on Easy-Open Ends.
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Based on X-Ray attenuation data analysis, X-SCORE is CMC-KUHNKE’s non-destructive system for measuring the residual score on Easy-Open Ends. The system is available as a semi-automated product (the operator merely inserts the ends) or as a fully-automated system. The X-SCORE system combines ease of use and reliability with excellent repeatability and accuracy.
The X-SCORE system uses a low kV X-Ray source that emits radiation, which is attenuated by the can end – with the level of attenuation depending on the thickness of the metal. The lids are placed in a customized holder, which is precision made to fit the Easy-Open End design in question. This holder is mounted on a motor-controlled precision linear table. Upon scanning, the can end is moved in relation to the X-Ray beam and a radiation counting detector. A very narrow slit ensures that the lateral precision during scanning is in the order of 3-5 microns. Thus, a Score Residual thickness is calculated based on the calibration table and the actually performed measurement.
Each Score Residual profile is measured in about 30 seconds, and the system can perform measurements of at least 40 profiles an hour. The X-SCORE system is controlled through use with our LIDscan software – advanced scanning software tailored to the analysis of the Score Residual measurement. An easy to use menu and touch screen monitor allow for operator friendly control of the X-SCORE system via a Windows based PC.
The measurement results are stored as text files and can be transferred to any other windows based software for further analysis. Optionally, a module is available to allow for networked access to the LIDscan software, to monitor the system and results from additional locations.
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